Search

Saeron Technology

Saeron Technology

Saeron Technology

Saeron Technology

HomeManufacturersSaeron Technology
1/4
Saeron Technology

Saeron Technology

Air SEM

Model

Series

Customized System


Transaction Process

Please contact the manufacturer/supplier.

Payment

Contact the manufacturer/supplier.

Delivery

Contact the manufacturer/supplier.

Shipment

Contact the manufacturer/supplier.

Origin

Contact the manufacturer/supplier.


Description

AIR SEM

Product Description : The world's first developed hybrid E-beam

 

Features

1) Observation & Measurement by In-situ SEM Imaging
2) Minimization of Charge-up Effect
3) Minimization of surface damage by electron beam
4) Optimization for biology sample observation
5) Quantification & Qualification of sample surface using EDS
6) FEG/ Lab6 Source SEM available

 

Specifications

Gun Specification

Tip Source (Schottky FEG / LaB6 Source Available)

Image Monitoring at maximum 30KeV Acceleration Voltage

Backscattered Electron Image  cquisition

 

Application

Biologuy Image Acquisition at High Magnification

Flat Panel Display imaging analysis

Sub-Micron sample imaging Observation

Inquiry

Komachine Inc.
Head Office:
Ace Dongbaek Tower 1-1101, 16-4,
Dongbaekjungang-ro 16beon-gil, Giheung-gu,
Yongin City, Gyeonggido, South Korea 17015
Branch Office:
606, Seoul Stratup Center, 10,
Noryangjin-ro, Dongjak-gu, Seoul, South Korea 06938
CEOCharlie Park
Corporate #535-86-00664

ⓒ2024 Komachine Inc. All rights reserved.