Electronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
AIS2000C
(Scanning Electron Microscope)
Product Descriptio : A compact normal SEM designed for customers including schools and research institutes
Patents and Certifications : CE Certficates
COMPACT SEM AIS2000C
Compact normal SEM for Academic Version II
Practical SEM for Customers including universities and research institutes
- SEM with stability and optimal performance
- Optimal 5-axis stage control.
Compact SEM - Minimal installation and operating space for maximized work efficiency
Features
1) Entry-level SEM with proven stability and optimal performance
2) A compact SEM with 5-axis stage control at a reasonable price
3) Equipped with powerful analysis S/W and various measurement tools!
4) ET-Type SE Detector (SE/BSE mode): Uncoated images provided!
5) “Minimized installation space” for the benefit of the office environment : 540(W) X 570(D) X 1500(H)mm³
6) Low Vacuum Mode supported
Specification
| ELECTRON OPTIC SYSTEM | |||
| Resolution | 3nm@SE | Magnification | 10X ~ 300,000X(Max.) (Additional Digital Zoom 2X, 4X, 8X) |
| Accelerating Voltage | 0.2kV ~ 30kV | Image Shift | 250μm (X,Y), Image Rotation (360°) |
| Stage Motorization & Movement (X, Y, Z)mm | 3-Axis[X, Y, R] Motorized Stage Stage : 50/60/45 mm (Tilt 0° ~ 60°, Rotation 360°) |
Chamber | Dia. 190X210(H)mm |
