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Wafer Inspection System
Model Name
-
Series
Semiconductor
Data
-
Manufacturer information
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Synapse Imaging

Semi conductor inspection system manufacturer, Inspection equipment, Measuring equipment, SMT, Wafer, FPP panel

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Manufacturer
Synapse Imaging
Product Type
Machine
Brand
-
SKU
34971
Product Name
Wafer Inspection System
Model Name
-
Size
-
Weight
-
Product Details

Wafer Defect Inspection System is an optical inspection equipment that inspects foreign material, broken, chip-out, scratch, PAD mark and discolor defects on wafer cell surface automatically 
 Synapse Imaging Wafer Inspection System

Synapse Imaging
Synapse Imaging
Semi conductor inspection system manufacturer, Inspection equipment, Measuring equipment, SMT, Wafer, FPP panel
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