HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured. Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors. These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
ㆍ Replica gratings from holographic aberration corrected master gratings ㆍ Holographic Master can be blazed by Ion-beam etching method for higher efficiency ㆍ Ideal for robust, compact and low stray light spectrometers ㆍ Several references available (not all are listed in the catalogue) ㆍ Large range of dispersion available (from few nm/ mm to above 100nm/mm) ㆍ Multiple spectral range from UV to IR ㆍ Coating: Al or gold.
Fig. 1: This illustration shows a “super corrected grating” imaging two independent sources onto two independent linear arrays. Spectrum 1 is a “sample spectrum” from slit 1 and spectrum 2 a reference spectrum from slit 2. These “slits” could be fiber optic inputs
Fig. 2: Typical implementation into a spectrograph
Product Management and Quality
ISO 9001 and ISO 14001 certified
Unique traceability with laser marking
State-of-the-art metrology
ITAR free products
Clean room storage of master gratings
RoHS / REACH compliant products
Customer Oriented and Confidentiality
Full confidentiality with mutual NDA
Blanket orders for large annual quantities
Long term relationship with co-designing
Three production facilities
ㆍ Spectral ranges: from 170 to 4180 nm ㆍ Average dispersion (nm/mm) : from 1 to 106 nm/mm ㆍ Diffraction efficiency optimized for UV, or Vis, or NIR ㆍ Radius of curvature : from 58 to 330 mm ㆍ Dimensions from 25 x 25 mm ㆍ For customers in need of larger dimensions, HJY can record a custom-made holographic grating master specifically for replication.
*This efficiency curve is absolute theoretical efficiency, calculated using rigorous electromagnetic theory, taking into account the true groove profiles of manufactured gratings measured with an atomic force microscope (AFM).