This product is manufactured by
Korea Instrument
Manufacturer information
Korea Instrument
Probe card for inspecting Semi conductor wafer
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Manufacturer
Korea Instrument
Product Type
Machine
Brand
-
SKU
49477
Product Name
MEMS Probe Card
Model Name
-
Size
-
Weight
-
Product Details
| Contact Force | 1 gram/mil (Stable contact force) |
| Probe Material, Tip Material | Nickel-Cobalt, Rhodium (Long life time) |
| PCB Size | 440mm (480mm) |
| Planarity | ± 4 μm |
| Contact resistance | ~ 1.5 Ohm |
| Overdrive | ~ 4 mil |
| Operating Temp | -25 ~ 100°C |
| Tip Alignment | ± 4 μm |
| Tip Diameter | 10 μm ± 2 μm |
| Tip Shape | Circular column |
| Contact Force | 1.0 gram/mil |
| Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
| PCB Size | 440mm or 480mm |
| Max Test Size | 100mm X 100mm |
| Planarity | ± 4 μm |
| Contact resistance | 2 ~ 3 Ohm |
| Overdrive | 4 mil |
| Operating Temp | -20°C ~ 85°C |
| X.Y Position | ± 4 μm |
| Tip Diameter | 10 μm ± 2 μm |
| Tip Shape | Circular cone |
| Contact Force | 1.0 gram/mil |
| Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
| PCB Size | 440mm or 480mm |
| Max Test Size | 100mm X 100mm |
| Planarity | ± 4 μm |
| Contact resistance | 2 ~ 3 Ohm |
| Overdrive | 4 mil |
| Operating Temp | -20°C ~ 85°C |
| X.Y Position | ± 4 μm |
| Tip Diameter | 10 μm ± 2 μm |
| Tip Shape | Round Bar |
| Contact Force | 0.5 gram/mil, 0.7 gram/mil, 1.0 gram/mil |
| Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
| PCB Size | 480mm |
| Max Test Size | 12 Inch |
| Planarity | ± 12.5 μm |
| Contact resistance | 2 ~ 3 Ohm |
| Overdrive | 4 mil |
| Operating Temp | -20°C ~ 100°C |
| X.Y Position | ± 12 μm |
| Tip Diameter | 5 μm x 10 μm ± 2 μm |
| Tip Shape | Round Bar |
