product Image
MEMS Probe Card
Model Name
-
Series
Memory Products
View All
Data
-
Manufacturer information
provider logo
Korea Instrument

Probe card for inspecting Semi conductor wafer

Problem with product info?
Update request
Manufacturer
Korea Instrument
Product Type
Machine
Brand
-
SKU
49477
Product Name
MEMS Probe Card
Model Name
-
Size
-
Weight
-
Product Details
More products
Cantilever Probe Card for LSI (ASIC)
Cantilever Probe Card for LSI (ASIC)
What is a Probe Card?
What is a Probe Card?
STC Products
STC Products
LSI MEMS Card : CIS
LSI MEMS Card : CIS
LSI MEMS Card : DC
LSI MEMS Card : DC
Vertical Probe Card for Flipchip
Vertical Probe Card for Flipchip
Fine Pitch Probe Card for DDI
Fine Pitch Probe Card for DDI
PSJS Probe Card
PSJS Probe Card
Cantilever Probe Card
Cantilever Probe Card
Korea Instrument
Korea Instrument
Probe card for inspecting Semi conductor wafer
Inquiry