This product is manufactured by
Korea Instrument
Manufacturer information
Korea Instrument
Probe card for inspecting Semi conductor wafer
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Manufacturer
Korea Instrument
Product Type
Machine
Brand
-
SKU
49476
Product Name
PSJS Probe Card
Model Name
-
Size
-
Weight
-
Product Details
| Contact Force | 1-2.5 gram/mil |
| Probe Material | Tungsten |
| PCB Size | Customer specified |
| Planarity | 18μm |
| Probe Depth | Customer specified |
| Overdrive | 2~3 mil |
| Operating Temp | -25 ~ 100°C |
| Tip Alignment | ± 12 μm |
| Tip Diameter | 16~22 μm |
| Tip Shape | Sharpe |
