X-ray Photoelectron Spectroscopy / XPS

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Auger Electron Spectroscopy / AES, SAM

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Time-of-Flight SIMS / TOF-SIMS

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Dynamic SIMS / D-SIMS

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Other Systems

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Components

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Database / Software

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X-RAY Source

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Ion Source For Sample Cleaning

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Electron Energy Analyser CHA

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Inverse Photomission IPES

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Electron Source For AES

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Electron Source For ELS

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Spectra Data Acquisition

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Multi-channel Detector MCD Upgrade

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