Information
2270-D Wyoming Blvd NE, Albuquerque, NM 87112, USA
+1 505-213-0151
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Overview
- Summary
- Development of software for data acquisition and analysis for semiconductor and microelectronic device design and quality assuranceDevelopment of software for data acquisition and analysis for semiconductor and microelectronic device design and quality assurance
- Key Products/Technologies
- Metrics Technology's core product line, specialized software solutions for semiconductor testing, instrument control, and data acquisitionMetrics Technology's core product line, specialized software solutions for semiconductor testing, instrument control, and data acquisition
- Metrics ICS (Interactive Characterization Software) offering control functions for various semiconductor test and measurement instruments, including Agilent/Keysight 4145, 4156, B1500A, B1505A, E5270A parameter analyzers and Keithley 2657A HV Source Measure UnitsMetrics ICS (Interactive Characterization Software) offering control functions for various semiconductor test and measurement instruments, including Agilent/Keysight 4145, 4156, B1500A, B1505A, E5270A parameter analyzers and Keithley 2657A HV Source Measure Units
- Easy setup of complex instrumentation through a Microsoft Windows graphical user interface without requiring end-user programmingEasy setup of complex instrumentation through a Microsoft Windows graphical user interface without requiring end-user programming
- Metrics ICV (I-V, C-V Characterization Automation Software) supporting semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and full or semi-automatic probe stationsMetrics ICV (I-V, C-V Characterization Automation Software) supporting semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and full or semi-automatic probe stations
- Metrics IDE providing a development environment integrated with ICVMetrics IDE providing a development environment integrated with ICV
- Proprietary technologies including device characterization, JEDEC standard-based wafer level reliability (WLR) algorithms, and failure analysis capabilities for root cause analysis in semiconductor components and microelectronicsProprietary technologies including device characterization, JEDEC standard-based wafer level reliability (WLR) algorithms, and failure analysis capabilities for root cause analysis in semiconductor components and microelectronics
- Compatibility with the latest Windows operating systems, node-locked licensing support, an expanded data view of up to 100 vectors and 10001 points, and automatic synchronization with MS ExcelCompatibility with the latest Windows operating systems, node-locked licensing support, an expanded data view of up to 100 vectors and 10001 points, and automatic synchronization with MS Excel
- Core Advantages
- User-friendly Microsoft Windows-based graphical user interface for easy setup of complex instrumentationUser-friendly Microsoft Windows-based graphical user interface for easy setup of complex instrumentation
- Specialization in semiconductor and microelectronic device testing, characterization, and analysisSpecialization in semiconductor and microelectronic device testing, characterization, and analysis
- Provision of integrated software solutions encompassing instrument control, data acquisition, numerical analysis, device characterization, wafer level reliability, and failure analysisProvision of integrated software solutions encompassing instrument control, data acquisition, numerical analysis, device characterization, wafer level reliability, and failure analysis
- Extensive compatibility with industry-standard test and measurement instruments from vendors such as Agilent, Keysight, Keithley, MPI, and SemiProbeExtensive compatibility with industry-standard test and measurement instruments from vendors such as Agilent, Keysight, Keithley, MPI, and SemiProbe
- Proven reliability and an extensive customer base built over 25 years, serving thousands of customers worldwide, including semiconductor manufacturers, research laboratories, and universitiesProven reliability and an extensive customer base built over 25 years, serving thousands of customers worldwide, including semiconductor manufacturers, research laboratories, and universities
- Advanced data processing and analysis capabilities, including handling large datasets of up to 100 vectors and 10001 points, and automatic synchronization with MS ExcelAdvanced data processing and analysis capabilities, including handling large datasets of up to 100 vectors and 10001 points, and automatic synchronization with MS Excel
- Support for JEDEC standard-based wafer level reliability algorithms for rapid reliability program implementation and root cause analysisSupport for JEDEC standard-based wafer level reliability algorithms for rapid reliability program implementation and root cause analysis
- Continuous software updates ensuring compatibility with the latest operating systems and enhanced security featuresContinuous software updates ensuring compatibility with the latest operating systems and enhanced security features
- Target Industries
- Semiconductor manufacturing industrySemiconductor manufacturing industry
- Microelectronics device design and quality assurance sectorsMicroelectronics device design and quality assurance sectors
- Research laboratories and university research fieldsResearch laboratories and university research fields
- Commercial electronics manufacturing industryCommercial electronics manufacturing industry
- Analytical laboratoriesAnalytical laboratories
- Major Markets
- USAUSA
- Certifications/Patents
- No explicit mention of official patents or certificationsNo explicit mention of official patents or certifications
- Technical reliability demonstrated through support for JEDEC industry standard-based wafer level reliability (WLR) test methodsTechnical reliability demonstrated through support for JEDEC industry standard-based wafer level reliability (WLR) test methods
- Expertise in specialized software development for semiconductor metrology and characterizationExpertise in specialized software development for semiconductor metrology and characterization
- Contribution to the optimization of semiconductor and microelectronic device design and quality assurance processes for client companiesContribution to the optimization of semiconductor and microelectronic device design and quality assurance processes for client companies
Introduction
Location
2270-D Wyoming Blvd NE, Albuquerque, NM 87112, USA
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