Information
A-1612, 13 Heungdeok 1-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea
+82 31-629-7791
-
-
Overview
- Summary
- A specialized contamination control company responsible for particle contamination issues from measurement to resolution, focusing on particle counters, foreign matter and particle diagnosis, improvement consulting, and related software developmentA specialized contamination control company responsible for particle contamination issues from measurement to resolution, focusing on particle counters, foreign matter and particle diagnosis, improvement consulting, and related software development
- Key Products/Technologies
- A diverse range of Surface Particle Counters, including the S300 Series, S5 Series, SA (Auto Scan, Smart Counting), SPro (Auto focus, fast scan), SMD Portable, S3 Series, SPOL2, and SMF5 models for liquids and gasesA diverse range of Surface Particle Counters, including the S300 Series, S5 Series, SA (Auto Scan, Smart Counting), SPro (Auto focus, fast scan), SMD Portable, S3 Series, SPOL2, and SMF5 models for liquids and gases
- Providing the M7000/M1000R25 (new) system for cleanliness and particle testing of semiconductor equipment parts, capable of inspecting various components such as shower heads, electrodes, ESCs, chucks, robot arms, focus rings, cleanroom wipers, and FOUPsProviding the M7000/M1000R25 (new) system for cleanliness and particle testing of semiconductor equipment parts, capable of inspecting various components such as shower heads, electrodes, ESCs, chucks, robot arms, focus rings, cleanroom wipers, and FOUPs
- The M802ESC inspection system, designed for nano-scale ultra-fine processes, enables precise inspection of large and heavy components, detecting particles from 0.1µm and optionally down to 10nmThe M802ESC inspection system, designed for nano-scale ultra-fine processes, enables precise inspection of large and heavy components, detecting particles from 0.1µm and optionally down to 10nm
- The SG20 Film Particle Counting System detects and counts particles on multi-layer films (OCA FILM, COVER GLASS, polarizing film) used in smartphone displays, also identifying the specific layer where particles resideThe SG20 Film Particle Counting System detects and counts particles on multi-layer films (OCA FILM, COVER GLASS, polarizing film) used in smartphone displays, also identifying the specific layer where particles reside
- Possessing patented transmissive detector technology for detecting surface foreign substances on transparent or translucent films, along with a hybrid detection method combining light scattering and image analysisPossessing patented transmissive detector technology for detecting surface foreign substances on transparent or translucent films, along with a hybrid detection method combining light scattering and image analysis
- Operating an independent foreign matter/particle laboratory, 'Particle House,' and developing and supplying cleanroom product evaluation devices, semiconductor manufacturing equipment part particle inspection and cleaning devices, and test materials for foreign matter extractionOperating an independent foreign matter/particle laboratory, 'Particle House,' and developing and supplying cleanroom product evaluation devices, semiconductor manufacturing equipment part particle inspection and cleaning devices, and test materials for foreign matter extraction
- Core Advantages
- A contamination control specialist providing end-to-end solutions from measurement to resolution of particle contamination issues, based on expert consultingA contamination control specialist providing end-to-end solutions from measurement to resolution of particle contamination issues, based on expert consulting
- Leveraging over 20 years of accumulated know-how in the semiconductor and display industries to offer specialized equipment and servicesLeveraging over 20 years of accumulated know-how in the semiconductor and display industries to offer specialized equipment and services
- Possessing patented transmissive detector technology that excels in detecting particles on the surface or inner layers of transparent and translucent glass or filmsPossessing patented transmissive detector technology that excels in detecting particles on the surface or inner layers of transparent and translucent glass or films
- Utilizing a patented hybrid detection method (light scattering + image analysis) for higher productivity by inspecting larger areas in less time compared to conventional equipmentUtilizing a patented hybrid detection method (light scattering + image analysis) for higher productivity by inspecting larger areas in less time compared to conventional equipment
- Demonstrating technological superiority through continuous development of next-generation inspection equipment like the M802ESC, capable of quantitative evaluation of large and heavy components with nano-scale precisionDemonstrating technological superiority through continuous development of next-generation inspection equipment like the M802ESC, capable of quantitative evaluation of large and heavy components with nano-scale precision
- Ensuring high detection performance and reliability through verification and calibration with NIST standard particlesEnsuring high detection performance and reliability through verification and calibration with NIST standard particles
- Pioneering the concept of surface cleanliness management in Korea and contributing to reducing product defects through the development of particle collection films and surface particle countersPioneering the concept of surface cleanliness management in Korea and contributing to reducing product defects through the development of particle collection films and surface particle counters
- Providing reliable high-performance equipment, materials, and accurate, efficient testing solutions across various environments, from laboratories to mass production processesProviding reliable high-performance equipment, materials, and accurate, efficient testing solutions across various environments, from laboratories to mass production processes
- Target Industries
- Semiconductor IndustrySemiconductor Industry
- Display IndustryDisplay Industry
- Battery IndustryBattery Industry
- Cleanroom Control and ManagementCleanroom Control and Management
- Optics/Camera ModulesOptics/Camera Modules
- PCB (Particles on PCBs)PCB (Particles on PCBs)
- Research, Labs, IQC, OQCResearch, Labs, IQC, OQC
- Automotive Industry (VDA19, ISO16232 standards compliance)Automotive Industry (VDA19, ISO16232 standards compliance)
- Major Markets
- --
- Certifications/Patents
- U.S. Patent No. US11002685: Surface foreign substance detector for transparent or translucent filmU.S. Patent No. US11002685: Surface foreign substance detector for transparent or translucent film
- U.S. Patent No. USD838609: Apparatus for detecting particle on test filmU.S. Patent No. USD838609: Apparatus for detecting particle on test film
- U.S. Patent No. US9964480: Test film for detecting surface particles in clean roomU.S. Patent No. US9964480: Test film for detecting surface particles in clean room
- Possession of patented technology for transmissive detectors and hybrid detection methodsPossession of patented technology for transmissive detectors and hybrid detection methods
- Equipment verification and calibration completed with NIST standard particlesEquipment verification and calibration completed with NIST standard particles
Introduction
Location
A-1612, 13 Heungdeok 1-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea
클릭하여 위치 살펴보기
