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Spectral coverage
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With 532 nm laser:210 to 3500 cm–1 With 660 nm laser:400 to 3150 cm–1 With 785 nm laser:210 to 2700 cm–1
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Numerical aperture
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F/3.1
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Stray light rejection Typical (Maximum)
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0.1% (0.2%) (measured with bandpass filter 780BP10)
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CCD Detector & Typical Q.E.
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Back-illuminated CCD with low etaloning in NIR 55% peak QE at 850nm(VIS optimized)
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Detector height Fiber-optic option
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300μm CCD height standard (1000μm optional) 200 or 300μm dia.,1m long fiber optic (for 1mm tall CCD, RTS bundle is offered)
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Thermoelectric stabilization
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None. Dark current and CCD-pattern noise must be subtracted. User must shutter in optical path. QE shifts slightly with temperature.
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Spectral resolution Pixel resolution Slit (factory configuration)
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785nm configuration;25μm slit; 2048 pixels; 8–12cm–1 resolution; 0.19nm/pixel (configuration with 300μm tall CCD) Available slits: 12-25-37-50-62-75-100-125-150-200μm (contact us for other gratings)
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Improved CCD full well Raw non linearity Factory corrected non linearity
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>250Ke- (sensitivity mode) <1% (sensitivity mode)
< 0.4% (sensitivity mode)
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Typical dynamic range
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7000:1 in sensitivity mode
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Readout speed
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8.6ms (500kHz mode); 116 spectra/s with 0 exposure time (Multi-Acq mode) Max: 4.5 ms (Ultra mode); 223 spectra/s with 0 exposure time (Multi-Acq mode)
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Typical Dark current
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1 count/ms at 20°C (room temp.); typical offset = 1000 counts
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Typical readout noise
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35 e- (Max= 45e-) in sensitivity mode (4 e–/count)
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A/D converter
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16 bit, 500 kHz (pixel rate); optional 2 MHz VIS-CCD
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Typical dynamic range
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7,000:1 in sensitivity mode
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Weight
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1.8 lb (0.82 kg)
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Gain selection
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4 e-/count and 8 e-/count
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Dimensions (H× W×D)
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4” × 2.71” × 1.49” (101.6 mm × 68.8 mm × 37.8 mm)
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* Specifications, Form Factor and Spectrometer Covers are subject to change without notice.
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