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SYSTEM KOREA

SYSTEM KOREA

SYSTEM KOREA

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SYSTEM KOREA

SYSTEM KOREA

Multi-Layer Thickness Gauge

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Description

OVERVIEW

This thickness gauge uses the white-light interference phenomenon for non-contact and non-destructive thickness determination of transparent single or double layers in the range of approximately 1-120 Micrometers.
This instrument is designed especially for manually performed, but even though high-precise measurements in the lab. 
  
 

CHARACTERISTICS

- Optical measurement : non-contact, non-destructive, non-radiation 
- The fully automatic and simultaneous measurement of double-layers 
- Very fast measurement and calculation 
- Useful desktop measurement with USB 2.0 connection 
- Very easy-to-use software 
- High-precision results in the entire measurement range. 
- Thickness range for transparent layer 
   FTM-Lite VIS : 1 ~ 25 μm
   FTM-Lite NIR : 2 ~ 100 μm
   FTM ProVis 2000 : 1 ~ 120 μm 

 

APPLICATION

Protect coating layer, Optical coating film, Automobile head Lamp coating etc.
 

Inquiry

Komachine Inc.
Head Office:
Ace Dongbaek Tower 1-1101, 16-4,
Dongbaekjungang-ro 16beon-gil, Giheung-gu,
Yongin City, Gyeonggido, South Korea 17015
Branch Office:
606, Seoul Stratup Center, 10,
Noryangjin-ro, Dongjak-gu, Seoul, South Korea 06938
CEOCharlie Park
Corporate #535-86-00664

ⓒ2024 Komachine Inc. All rights reserved.