Wafer Defect Inspection System is an optical inspection equipment that inspects foreign material, broken, chip-out, scratch, PAD mark and discolor defects on wafer cell surface automatically
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Komachine Inc.
Head Office:
Ace Dongbaek Tower 1-1101, 16-4,
Dongbaekjungang-ro 16beon-gil, Giheung-gu,
Yongin City, Gyeonggido, South Korea 17015
Branch Office:
606, Seoul Stratup Center, 10,
Noryangjin-ro, Dongjak-gu, Seoul, South Korea 06938