1. Surface Crack Detection
2. Detection of the Foreign Material and the Contamination of the Wafer Surface
3. Edge Chipping Detection
4. Saw Mark Detection
5. Size Measurement
6. Squareness & Parallelization
※ This system can be customized for the customer's needs.
Solar Cell Inspection System
Solar Wafer Production Line has a problem to achieve mass production because of the standardization and automation problems.
This system is vision inspection technoly applied and has automatic operating capability.
ㆍ Thickness variation measurement techniques which use laser technology (ASTM standard)
ㆍ Micro crack and internal defect detection
ㆍ Available for both inline and parts auto inspection
ㆍ Geometric and optical solar cell wafer defect detection
ㆍ 3D Wafer Drawing
Througe this systemquality stability and higher productivity can be achived.