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SHONICS

SHONICS

Solar Cell Inspection System

Model

Series

F/A & Vision Solution


Transaction Process

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Payment

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Delivery

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Shipment

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Origin

Korea (Republic of)


Description

System Specification

Measurement

1. Thickness & Flatness 2. Bow & 15 points Warp

Wafer Inner Inspection

1. Micro Crack Detection 2. Inner Bubble & Defects Detection

Wafer Surface Inspection

1. Surface Crack Detection
2. Detection of the Foreign Material and the Contamination of the Wafer Surface
3. Edge Chipping Detection
4. Saw Mark Detection
5. Size Measurement
6. Squareness & Parallelization

 

※ This system can be customized for the customer's needs.

 

Solar Cell Inspection System

 

Solar Wafer Production Line has a problem to achieve mass production because of the standardization and automation problems.
This system is vision inspection technoly applied and has automatic operating capability.

 

ㆍ Thickness variation measurement techniques which use laser technology (ASTM standard)
ㆍ Micro crack and internal defect detection
 Available for both inline and parts auto inspection
 Geometric and optical solar cell wafer defect detection
 3D Wafer Drawing

Througe this system quality stability and higher productivity can be achived.

 

Inquiry

KOMACHINE CO., LTD.
CEO  Charlie ParkCorporate #  553-86-00664
(Post 17015) 1101ho ,16-4, Dongbaekjungang-ro 16beon-gil, Giheung-gu, Yongin-si, Gyeonggi-do, Republic of Korea

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