Probe Head

Kelvin probe head is designed using LEENO’s best processing technology. The Probe Head can have a long life span using optimized Kelvin spring probe contacts which also can be used for high current wafer testing. Fine pitch spring probes or Cobra pins can provide 92um pitch with greater than 30K points on the Probe Card.

Specifications

- Package type

Wafer (WLCSP)

- Pitch

92㎛~

- Testing Characteristics

Kelvin type, Cobra type, RF type

Product Series