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  • ATI, Advanced Technology

    CIS Inspection System
    Model
    ACIS-1200 Series
    Series
    Semiconductor

    Product Description

    CIS Sensor & Glass Inspection 

    ▪ Inspection Item
      - Glass Top & Bottom Pit, Dent, Particle, Contamination, Scratch, Glass chipping

    ATI, Advanced Technology CIS Inspection System ACIS-1200 Series

     

    - Glass Top Defect Photo

    ATI, Advanced Technology CIS Inspection System ACIS-1200 Series 1

     

    - Glass BTM Defect Photo

    ATI, Advanced Technology CIS Inspection System ACIS-1200 Series 2

    Product List

    Semiconductor

    Wafer Inspection System
    WIND
    Auto Scope System
    OAK
    CIS Inspection System
    ACIS-1200 Series
    Reticle Macro AFVI
    SUN
    Packaging Inspection System
    CYPRESS

    LED

    LED Wafer AFVI
    AVIS-5000P
    LED Chip AFVI
    AVIS-5000C

    PCB

    IC Package Substrate AFVI
    AVIS-1800 Series
    HDI PCB AFVI
    AVIS-3600 Series
    IC Package Substrate Sorting System
    ASIS-1000C

    Laser Application

    Laser Marking System
    LMS Series
    Fiber Laser Cutting System
    ALC-100
    UV Laser Micro Machining System
    ULC-100

    Bio-medical Automation

    High Throughput Screening (Microarray Spotter)
    ezJet
    High Throughput Screening (Fluorescence Scanner)
    ezScan
    OEM Product Development (Automated NA Extractor)
    OEM Product Development (Cell Isolator)