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ATI, Advanced Technology

ATI, Advanced Technology

ATI, Advanced Technology

ATI, Advanced Technology

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ATI, Advanced Technology

ATI, Advanced Technology

Reticle Macro AFVI

Model

Series

Semiconductor


Transaction Process

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Origin

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Description

Reticle Macro Inspection 

▪ Particle inspection on all area of reticle : 

   - Pellicle, Pellicle Frame, Pattern, Backside

▪ Multi scanning with vertical and oblique optical system

▪ Inspection of various reticles with 1 recipe 

   - No prior work for each mask needed

▪ Applicable to full automation

▪ 0.5um pinhole/particle detection in non-pattern area

▪ Optional function to distinguish particle position at top/bottom of pellicle

▪ Verifying review module included

ATI, Advanced Technology Reticle Macro AFVI SUN

Inquiry

Komachine Inc.
Head Office:
Ace Dongbaek Tower 1-1101, 16-4,
Dongbaekjungang-ro 16beon-gil, Giheung-gu,
Yongin City, Gyeonggido, South Korea 17015
Branch Office:
606, Seoul Stratup Center, 10,
Noryangjin-ro, Dongjak-gu, Seoul, South Korea 06938
CEOCharlie Park
Corporate #535-86-00664

ⓒ2024 Komachine Inc. All rights reserved.